DA-Integrated Test Floor


The Diamond test platform is a low-cost, high-throughput production test solution for cost-sensitive devices. Its small footprint, minimal facilities requirements and low power consumption drive down overall cost of test. High-density digital and analog instruments are suitable for testing a range of devices, including; DVD player/recorder, DTV and STB demodulators and decoders, baseband devices, PC peripheral SOCs as well as 8/16/32-bit microcontrollers.
Current DA-Integrated Configuration

The requirements of today's SOC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. The scalable platform architecture of the Verigy V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed as well as the lowest noise floor. Because of its high integration and decentralized resources, the Verigy V93000 SOC Series offers unprecedented scalability and control. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change.
Current DA-Integrated Configuration

The X-Series test platform offers a range of configurations designed to provide low-cost testing of a broad range of devices used in mobile, power, automotive, industrial and instrumentation markets. The X-Series has been designed to meet the challenges of testing a broad range of advanced mixed signal device technologies used in these markets. It offers a large suite of DC, power, DSP, RF and digital instrumentation that can be configured into a true mixed signal infrastructure.
Current DA-Integrated Configuration

DA-Integrated has a rich history of design and test solution developments for devices that exceed ATE capability. In some cases, the level of testability and tester instrument augmentation makes the ATE itself close to redundant. DA-Integrated offers specialized technology for these devices;
- a full featured ATE system including hanlder interfaces, data hanlding, program revision control and operator interface
- this "virtual ATE" system is compiled on a normal computer (linux, PC or Mac) and interfaced to custom instrumentation and instrumentation control software.
Very high complexity devices and extremely cost sensitive devices are examples of products that benefit from this unique solution.
Solutions developed on this ultra low cost environment can run production in our lab or consigned as a customer-owned test cell on your offshore assembly/test factory floor.

Once considered the dominant platform in the fabless test ecosystem, the Credence Quartet One lives on as a reliabile, user-friendly, well deployed workhorse. At DA-Integrated, we continue to use our Quartet to support legacy production as well as introduce new products on our floor into a reliable, low volume/low cost test environment.
Current DA-Integrated Configuration

Our Signatone Microprobe station is equipped with GGB 110GHz probes. We have a pre-defined pad ring, enabling customers to tape out test chips that fit seemlessly into our precision characterization environment.
By leveraging the skills of our design group, DA-Integrated offers our customers a "hard macro in - characterization report out" service.

EG4090 prober. 200mm for development and production. Up to 300mm for development.

The WEB QT Test Handler is a bench top semiautomatic system designed for small lot production runs, engineering characterization, and other QC/QA applications. Device kits are available for a variety of package types including SOIC, MSOP, QFN, SOT, and many others.
Seiko-Epson HM3500 Hanlder

A well deployed workhorse handler. Well suited for LGA and BGA from very large body (>40mm) down to medium size (~5mm).

-65C through 150C+. Our floor features multiple Thermostream units for characterization purposes, a peltier diode based unit that integrates into a socket lid for low volume manual test, and serveral other oven based systems to meet your requirements.
Peripheral Equipment

Our test floor features a large suite of bench instruments including, BERT, High Speed Scopes, Spec-A, Power Supplies, Parametric Analyzers.
These instruments are used for characterization, correlation and debug purposes. They are also all set up to be controlled by ATE to augment tester capability for production test of high complexity devices.