RESOURCES

Advantest Smart Scale

Chroma 3650

Rohde & Schwarz ZVA67

Xcerra (LTX/Credence) Diamond D10

Advantest (Verigy) 93000

Xcerra (LTX) Fusion CX

DA-Integrated Chameleon

Synopsys

Cadence

Mentor Graphics

Syntricity dataConductor

Test Insight

RADAR

Microprobe

Wafer Probe

Package Handlers

Temperature Characterization

Tape and Reel

 

The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change.

 

Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test, high accuracy, powerful software tools and excellent reliability, 3650 has the versatile test capabilities for high-performance microcontroller, analog IC, consumer SoC devices, and wafer sort applications. The 3650 achieves lower test cost not only by reducing the cost of tester system but also by testing more devices faster and the high parallel test capability.

 

The R&S ZVA67 is an ideal choice for demanding measurements in the lab and in production. From filter measurements requiring maximum dynamic range to linear and nonlinear measurements on amplifiers and mixers as well as on receivers and transceivers.

 

The Diamond test platform is a low-cost, high-throughput production test solution for cost-sensitive devices. Its small footprint, minimal facilities requirements and low power consumption drive down cost of operation, and make Diamond ideal for personal use in the lab or office. High-density digital and analog instruments are suitable for testing of DVD player/recorder, DTV and STB demodulators and decoders, baseband devices, PC peripheral SOCs as well as 8/16/32-bit microcontrollers.

 

The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed as well as the lowest noise floor. Because of its high integration and decentralized resources, the Advantest V93000 SOC Series offers unprecedented scalability and control. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. DA-Integrated also supports development on Pinscale and other advanced versions of the system. 

 

The DA-Test Fusion CX platform has been configured to target the RF/Wireless IC market. The RF3500 subsystem provides fully integrated test support for a wide range of wireless devices including; cellular phones (AMPS, CDMA, D-AMPS, GSM, IS-136, IS-95, PDC, PHS); cordless phones (CT1, CT2, DECT); satellites (DBS,GPS); local area networks (WLAN); Pagers (POCSAG, Flex). 

 

Synopsys provides a comprehensive portfolio of tools for digital and mixed-signal IC design, implementation, signoff, verification, test, and design for manufacturability (DFM). Based on industry standards, Synopsys tools are production-proven down to 20 nm and concurrently optimize trade-offs between speed, area, power, test, and yield. In addition, Synopsys offers the industry’s “golden” signoff timing and extraction solutions, and has unmatched third-party support for technology libraries, services, and IP. In short, Synopsys offers the fastest path to accelerated innovation. 

 

Cadence enables global electronic-design innovation and plays an essential role in the creation of today’s integrated circuits and electronics. Customers use Cadence® software and hardware, methodologies, and services to design and verify advanced semiconductors, consumer electronics, networking and telecommunications equipment, and computer systems.

 

Achieving Optimal Designs through Electronic System Level (ESL) Methodologies Mentor Graphics Electronic System Level (ESL) design methodologies elevate design to a higher level of abstraction. Using this methodology, designers can create, optimize and verify designs that are tailored to their specifications 10-100X more efficiently than traditional methodologies.

 

Fully custom test solution using DA-Labs Chameleon Test Control software and fully custom test instrumentation. This solution provides optimized product quality and cost of test for microelectronic products that do not fit on standard ATE.

 

dataConductor is an interactive enterprise yield management solution for the semiconductor industry. With dataConductor, semiconductor manufacturers can collect data from diverse, global manufacturing systems and combine them into a single warehouse to manage yields during data characterization, yield ramp and volume production.

 

TestInsight solutions are De-facto industry standard in ATE conversion tools. TestInsight is the selected partner of the major ATE companies. TestInsight is pioneering in Test Program Management + Control solutions. TestInsight solutions provide - Design & Test Close Loop.

 

RADAR is a set of scripts written in the R language that can process STDF files and generate summary files, statistics tables, histograms, XY plots, wafermaps and more. The scripts will work on many different platforms (Windows, Linux, Unix, ...) since R is supported on many platforms. The scripts run quickly, since R is an efficient language. R is also very friendly for doing subsequent "what about..." investigations of your data. 

 

DA-Integrated Microprobe capability inlcudes a Signatone Microprobe station and GGB 80GHz probes. We have a standard pad ring that enables designers to tape out a test chip that we can characterize quickly and efficiently. Our expertise also includes library characterization capability. 

http://www.signatone.com/index.asp 

Wafer Probe

 

DA-Integrated has capability for wafer probe solution development and production. Tel P12 and EG4090 enables wafer probe from 3 inch through 12 inch. Capablity and experience includes Known Good Die, including RFIC and SerDes. 

 

Package Handlers

 

Our test lab includes several package handlers, enabling production testing of a variety of standard and custom packages.

 

Temperature Characterization


We have several temperature forcing units, enabling characterization from -65C through 125C.

 

Tape and Reel

 

Tape and Reel. Full capability, please inquire.